Apparatus for supporting microelectronic substrates

ABSTRACT

058804113 A method and apparatus for supporting a microelectronic substrate. The apparatus can include a microelectronic substrate and a support member carrying the microelectronic substrate. The apparatus can further include a first connection structure carried by the support member. The first connection structure can have a first bond site configured to receive a flowable conductive material, and can further have at least two first elongated members connected and extending outwardly from the first bond site. Each first elongated member can be configured to receive at least a portion of the flowable conductive material from the first bond site, with none of the first elongated members being electrically coupled to the microelectronic substrate. The assembly can further include a second connection structure that is electrically coupled to the microelectronic substrate and that can include second elongated members extending away from a second bond site. The number of second elongated members can be equal to the number of first elongated members.

BACKGROUND

The present invention is directed toward methods and apparatuses forsupporting microelectronic substrates. Conventional microelectronicdevice packages typically include a microelectronic substrate mounted ona support member and packaged with an encapsulant. In one conventionalarrangement shown in FIG. 1, a microelectronic device package 10 caninclude a support member 20 having a front surface 21 and a rear surface22 facing opposite the front surface 21. The support member 20 can alsohave a slot 23 extending from the front surface 21 to the rear surface22. A microelectronic substrate 40 (visible through the slot 23) isattached to the rear surface 22, and has wire bond pads 41 that areaccessible through the slot 23 for coupling to the support member 20.Accordingly, the support member 20 can include active trace patterns 30,each of which has a wire bond pad 32, a ball bond pad 31, and aconnecting trace 33 extending between the wire bond pad 32 and the ballbond pad 31. Each active trace pattern 30 can also include anelectroplating trace 34 coupled to an electroplating bus 24 to provideelectrically conductive coatings on the active trace pattern 30 duringthe formation of the support member 20.

In operation, the wire bond pads 32 of the active trace patterns 30 areconnected to corresponding wire bond pads 41 of the microelectronicsubstrate 40 with wire bonds 42. A solder ball (not shown in FIG. 1) canthen be disposed on each ball bond pad 31. The wire bonds 42 and thewire bond pads 41 and 32 can then be covered with an encapsulatingmaterial for protection, while the solder balls remain exposed. Theexposed solder balls can be connected to other devices to provide forcommunication between those devices and the packaged microelectronicsubstrate 40.

In order to conform with industry standards, similar device packages 10are often required to have the same number of solder balls, even if notall the solder balls are required to provide communication with themicroelectronic substrate 40. Accordingly, the support member 20 caninclude inactive trace patterns 50. Each inactive trace pattern 50 caninclude a ball bond pad 51 that supports a solder ball, and anelectroplating trace 54 for electroplating conductive coatings on theinactive trace pattern 50. The inactive trace patterns 50 do not includea wire bond pad 32 or a corresponding connecting trace 33. Accordingly,the inactive trace patterns 50 do not provide electrical communicationto or from the microelectronic substrate 40. However, the inactive tracepatterns 50 can support solder balls which, together with the solderballs on the active trace patterns 30, define a uniform pattern ofsolder balls that can be compatible with a variety of devices in whichthe package 10 is installed and/or tested.

FIG. 2 illustrates a conventional test apparatus 60 for testing devicepackages such as the package 10 described above with reference to FIG.1. In one aspect of this arrangement, the test apparatus 60 can includea base 61 that supports the device package 10. An overlying frame 62secures the package 10 to the base 61. When the package 10 is secured tothe base 61, solder balls 25 of the package 10 remain exposed through anopening 65 in the frame 62. A test jig 63 is then aligned with the base61 such that test contacts 64 of the jig 63 make physical and electricalcontact with the solder balls 25 of the package 10. The test jig 63 isthen used to test the operational characteristics of the device package10.

One drawback with the foregoing arrangement is that the test jig 63 canpartially or completely dislodge some of the solder balls 25 and/or thetrace patterns to which the solder balls 25 are connected. The dislodgedsolder balls 25 and/or trace patterns can increase the incidence ofshort circuits in the package 10, and accordingly packages with thesedefects are typically discarded.

SUMMARY

The present invention is directed toward methods and apparatuses forsupporting microelectronic substrates. An apparatus in according withone aspect of the invention includes a microelectronic substrate, asupport member carrying the microelectronic substrate, and a connectionstructure carried by the support member. The connection structure canhave a bond site configured to receive a flowable conductive material,such as solder, and the connection site can further have at least twoelongated members connected to and extending outwardly from the bondsite. Each elongated member can be configured to receive at least aportion of the flowable conductive material from the bond site, and noneof the elongated members is electrically coupled to the microelectronicsubstrate.

In a further aspect of the invention, the connection structure can be afirst connection structure and the elongated members can be firstelongated members. The apparatus can include a second connectionstructure carried by the support member and having a second bond siteconfigured to receive a flowable conductive material. The secondconnection structure can be electrically coupled to the microelectronicsubstrate and can have second elongated members extending outwardly fromthe second bond site, with each of the second elongated membersconfigured to receive at least a portion of the flowable conductivematerial from the second bond site. The number of second elongatedmembers for each second connection structure can equal the number offirst elongated members for the first connection structure.

The invention is also directed to a method for coupling a flowableconductive material to a microelectronic substrate. The method caninclude aligning a support member to receive the flowable conductivematerial, with the support member having a support surface configured tocarry a microelectronic substrate, and further having a first connectionstructure and second connection structure. The first connectionstructure can have a first bond site configured to receive the flowableconductive material and can be configured to remain decoupled from themicroelectronic substrate when a support member carries themicroelectronic substrate. The second connection structure can have asecond bond site configured to receive the flowable conductive material,and can be configured to be electrically coupled to the microelectronicsubstrate when the support member carries the microelectronic substrate.The method can further include disposing a first quantity of theflowable conductive material on the first bond site, wicking a firstportion of the first quantity of flowable material along first elongatedmembers connected to and extending outwardly from the first bond site,and disposing a second quantity of the flowable conductive material onthe second bond site. The method can further include wicking a secondportion of the second quantity of flowable conductive material alongsecond elongated members extending outwardly from the second bond site,with the second portion of the flowable conductive material having avolume approximately equal to a volume of the first portion. The firstquantity of flowable conductive material can form a first conductivecoupler, the second quantity can form a second conductive coupler, andeach conductive coupler can project from the support member byapproximately the same distance.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a bottom view of a microelectronic device package inaccordance with the prior art, with selected features shownschematically.

FIG. 2 is a partially exploded illustration of a test apparatus fortesting microelectronic device packages in accordance with the priorart.

FIG. 3A is a plan view of a support member having active and inactiveconnection structures in accordance with an embodiment of the invention.

FIG. 3B is an enlarged view of a portion of the support member shown inFIG. 3A, connected to a microelectronic substrate in accordance with anembodiment of the invention.

FIG. 3C is an isometric view of portions of active and inactiveconnection structures, with certain features shown schematically inaccordance with an embodiment of the invention.

FIG. 3D is an enlarged plan view of another portion of the supportmember shown in FIG. 3A, connected to a microelectronic substrate inaccordance with an embodiment of the invention.

FIG. 4 is an enlarged plan view of a portion of a support member inaccordance with another embodiment of the invention.

FIG. 5 is a plan view of a portion of a support member having active andinactive connection structures configured for electroplating inaccordance with another embodiment of the invention.

FIG. 6 is a plan view of a portion of a support member having active andinactive connection structures configured for electroless plating inaccordance with another embodiment of the invention.

FIG. 7 is a plan view of a portion of a support member having active andinactive connection structures configured for electroplating inaccordance with yet another embodiment of the invention.

FIG. 8 is a plan view of a portion of a support member having active andinactive connection structures configured for electroless plating inaccordance with still another embodiment of the invention.

FIG. 9 is a schematic illustration of a device that includes apparatusesin accordance with another aspect of the invention.

FIG. 10 is a cross-sectional side view of an apparatus including amicroelectronic substrate and a connection structure in accordance withanother embodiment of the invention.

FIG. 11 is a plan view of the apparatus shown in FIG. 10 in accordancewith an embodiment of the invention.

FIG. 12A is a cross-sectional side view of an apparatus including amicroelectronic substrate and a connection structure having elongatedmembers in accordance with yet another embodiment of the invention.

FIG. 12B is a top isometric view of a portion of the apparatus shown inFIG. 12A.

FIG. 13A is a cross-sectional side view of an apparatus including amicroelectronic substrate and a connection structure in accordance withstill another embodiment of the invention.

FIG. 13B is a top isometric view of a portion of the apparatus shown inFIG. 13A.

FIG. 14 is a top plan view of a support member in accordance withanother embodiment of the invention.

FIG. 15 is a bottom plan view of the support member shown in FIG. 14 inaccordance with an embodiment of the invention.

DETAILED DESCRIPTION

The present disclosure describes packaged microelectronic substrates andmethods for forming such packages. The term “microelectronic substrate”is used throughout to include substrates upon which and/or in whichmicroelectronic circuits or components, data storage elements or layers,and/or vias or conductive lines are or can be fabricated. Many specificdetails of certain embodiments of the invention are set forth in thefollowing description and in FIGS. 3A-9 to provide a thoroughunderstanding of these embodiments. One skilled in the art, however,will understand that the present invention may have additionalembodiments, and that the invention may be practiced without several ofthe details described below.

As described above with reference to FIGS. 1 and 2, a drawback with someconventional arrangements is that the solder balls and/or trace patternsof the packaged device can become dislodged during testing, whichtypically requires discarding the package. In some cases, it has beenobserved that the inactive solder balls and traces may become dislodgedmore frequently than the active solder balls and traces. Accordingly, inseveral of the embodiments described below, the inactive traces (orconnection structures) are more securely attached to the support member,and/or are configured to be symmetric with the active traces (orconnection structures). Accordingly, the solder balls or otherconductive couplers disposed on the inactive connection structures canhave a size, shape and support generally similar to the size, shape andsupport of the conductive couplers disposed on the active connectionstructures. As a result, the package can be less likely to be damagedduring testing or installation.

FIG. 3A is a plan view of an apparatus 110 having a support member 120in accordance with an embodiment of the invention. The support member120 can have a first surface 121 that supports active connectionstructures 130 and inactive connection structures 150. The first surface121 can also include plating buses 124 (shown in FIG. 3A as edge platingbuses 124 a and a central plating bus 124 b)that provide current forplating conductive materials onto the active connection structures 130and the inactive connection structures 150 as these structures aremanufactured. The support member 120 can further include a secondsurface 122 facing in an opposite direction from the first surface 121and configured to support a microelectronic substrate for coupling tothe active connection structures 130. The support member 120 can includea relatively thin sheet of flexible, epoxy resin, such as BT(bimaleimide triazine) or another suitable material.

FIG. 3B is a detailed plan view of a portion of the apparatus 110described above with reference to FIG. 3A, attached to a microelectronicsubstrate 140. As shown in FIG. 3B, the central plating bus 124 (FIG.3A) has been removed to form a slot 123 that extends through the supportmember 120 from the first surface 121 to the second surface 122. Themicroelectronic substrate 140 has been mounted to the second surface 122of the support member 120 such that wire bond pads 141 of themicroelectronic substrate 140 are accessible through the slot 123 forconnecting to the active connection structures 130 on the first surface121 of the support member 120.

The active connection structures 130 can each include an active bondsite 131, such as a ball bond pad, which is configured to support avolume of a flowable conductive material, such as solder. When theflowable conductive material is disposed on the active bond site 131 andplaced in a flowable state (for example, in a solder reflow oven), itcan form an at least partially spherical or globular shape suitable forelectrically and physically connecting the active connection structure130 to other devices or circuit elements. The active connectionstructure 130 can further include two active elongated members 133,shown in FIG. 3B as active elongated members 133 a and 133 b. The activeelongated member 133 a extends away from the slot 123 for connecting tothe edge plating bus 124 a (FIG. 3A). The active elongated member 133 bextends between the active bond site 131 and a wire bond pad 132positioned adjacent to the slot 123. The wire bond pad 132 can beconnected with a wire bond 142 to a corresponding one of the wire bondpads 141 of the microelectronic substrate 140 to provide electricalcommunication between the wire bond pad 141 and the active bond site131.

The inactive connection structures 150 can each include an inactive bondsite 151, such as a ball bond pad, coupled to two inactive elongatedmembers 153, shown in FIG. 3B as inactive elongated members 153 a and153 b. Accordingly, the inactive bond site 151 can support a flowableconductive material, such as a solder ball. The inactive elongatedmember 153 a extends away from the slot 123 for connecting to the edgeplating bus 124 a (FIG. 3A). The inactive elongated member 153 b can beshorter than the inactive elongated member 153 a to define an elongatedtab shape, and can remain electrically decoupled from themicroelectronic substrate 140. Accordingly, the inactive bond sites 151are not electrically connected to the microelectronic substrates 140;however, the solder balls they support (in combination with the solderballs of the active bond sites 131) can form a uniform pattern that iscompatible with a variety of electronic devices and test fixtures.

FIG. 3C is an isometric view of a portion of the support member 120showing an active connection structure 130 and an inactive connectionstructure 150, each carrying a quantity of flowable conductive material125 in accordance with an embodiment of the invention. Accordingly, theflowable conductive material 125 can form conductive couplers 129 (suchas solder balls), shown in FIG. 3C as an active conductive coupler 129 asupported by the active connection structure 130, and an inactiveconductive coupler 129 b supported by the inactive connection structure150. In one aspect of this embodiment, the active elongated members 133a,b and the inactive elongated members 153 a,b can include materialsthat are easily wetted by the flowable conductive material 125. Forexample, when the flowable conductive material 125 includes solder, theelongated members 153 a,b and 133 a,b can include nickel, gold, and/orcopper or other metallic constituents. Accordingly, when the flowableconductive material 125 is disposed on the bond sites 131 and 151, ittends to wick along the elongated members 133 a,b and 153 a,b,respectively. When the flowable conductive material 125 solidifies toform the conductive couplers 129, it can have an at least partiallyelipsoid shape.

In a further aspect of this embodiment, the support member 120 canoptionally include a cover layer 126 attached to the first surface 121with the connection structures 130 and 150 disposed between the coverlayer 126 and the first surface 121. In one embodiment, the cover layer126 can include a solder mask, and in other embodiments, the cover layer126 can include other materials. In any of these embodiments, the coverlayer 126 can have apertures 127 (shown as apertures 127 a and 127 b)aligned with the bond sites 131 and 151, respectively. The apertures 127are sized to leave the bond sites 131 and 151 exposed, while covering atleast part of each elongated member 133 a,b and 153 a,b to aid insecuring the elongated members to the support member 120. In analternative embodiment (shown in dashed lines in FIG. 3C) the aperturesare sized to leave the bond sites 131 and 151 exposed while coveringeach elongated member 133 a,b and 153 a,b up to the edge of thecorresponding bond site 131, 151. In other embodiments, the elongatedmembers 133 a,b can be secured directly to the first surface 121 withoutthe cover layer 126.

In one embodiment, the bond sites 131 and 150 can each have a diameterof about 330 microns, and each elongated member 133 a,b and 153 a,b (andin particular, the inactive elongated member 153 b) can have a length Lof at least 250 microns. The apertures 127 a,b in the cover layer 126can have a diameter of about 430 microns. Accordingly, each bond site131, 151 can be completely exposed through the corresponding aperture127 a, 127 b. A portion 128 of each elongated member 133 a,b and 153 a,bcan also be exposed for a distance D₁ of about 50 microns, measured fromthe edge of the corresponding bond site 131, 151, respectively. Theelongated member 153 b can be covered by the cover layer 126 for adistance D₂ of about 200 microns, and the remaining elongated memberscan be covered for distances greater than D₂. In other embodiments, theforegoing dimensions can have other values.

In a further aspect of this embodiment, each elongated member 153 a,band 133 a,b can have approximately the same width W in a directiontransverse to the elongation direction to increase the likelihood thatthe flowable conductive material 125 will wick along each elongatedmember in at least approximately the same way. In yet a further aspectof this embodiment, the angular spacing between the active elongatedmembers 133 a and 133 b can be about the same as the angular spacingbetween the inactive elongated members 131 a and 131 b (about 180° inFIGS. 3A-C).

One feature of the foregoing arrangement is that the number of inactiveelongated members 153 extending away from the inactive bond site 151 isequal to the number of active elongated members 133 extending away fromthe active bond site 131. Accordingly, the cover layer 126 (oralternatively the elongated members alone) can provide approximately thesame securing force to both the inactive connection structure 150 andthe active connection structure 130. As a result, the inactive elongatedmembers 153 a,b can be less likely to pull away from the support member120 when subjected to stresses, such as shear stresses which may beimposed on the conductive couplers 129 during testing. This feature canapply when the cover layer 126 covers some or all of the elongatedmembers, and/or when the cover layer 126 is not implemented. This isunlike some conventional arrangements (such as those described abovewith reference to FIGS. 1 and 2) for which the inactive connectionstructure may have fewer elongated members than the active connectionstructure and may accordingly be more likely to pull away from thesupport member when subjected to shear or other stresses.

Another feature of an embodiment of the arrangement described above withreference to FIGS. 3A-C is that the inactive elongated members 153 canwick away the flowable conductive material 125 in generally the samemanner and to generally the same extent as the active elongated members133. For example, because the number of inactive elongated members 153extending away from each inactive bond site 151 can be the same as thenumber of active elongated members 133 extending away from each activebond site 131, the flowable conductive material 125 will tend to wickaway from both bond sites in generally the same way. Accordingly,approximately the same volume of flowable conductive material will tendto wick along each elongated member and away from each bond site,whether the bond site is active or inactive.

Another feature of an embodiment of the arrangement described above withreference to FIGS. 3A-C is that the angular spacing between adjacentinactive elongated members 153 can be about the same as the angularspacing between adjacent active elongated members 133. As a result, theoverall size and shape of flowable conductive material 125 remaining onthe inactive bond site 151 (forming the inactive conductive coupler 129b) can be approximately the same as the overall size and shape of theflowable conductive material 125 remaining on the active bond site 131(forming the active conductive coupler 129 a). For example, the heightH₂ by which the inactive conductive coupler 129 b projects from thesupport member 120 can be at least approximately the same as the heightH₁ by which the active conductive coupler 129 a projects from thesupport member 120.

Yet another feature of an embodiment of the arrangement describe abovewith reference to FIGS. 3A-C is that the distance D₁ can be at leastapproximately the same for both the active elongated members 133 a,b andthe inactive elongated members 153 a,b. Accordingly, the flowableconductive material 125 (which tends to wick along the exposed portionsof the elongated members, but not beneath the cover layer 126) can wickaway from the inactive bond site 151 in generally the same manner and togenerally the same extent as it wicks away from the active bond site131. As a result, the shape of the inactive conductive coupler 129 b canbe at least approximately identical to the shape of the activeconductive coupler 129 a.

An advantage of the foregoing features is that the inactive conductivecouplers 129 b can be contacted by a conventional test fixture (such asthe fixture 60 shown in FIG. 2) in generally the same manner as are theactive conductive couplers 129 a because the shapes and sizes of theconductive couplers 129 a,b are about the same. This is unlike someconventional arrangements (such as the arrangement described above withreference to FIG. 1) in which the inactive solder balls may project fromthe support member by a greater distance than the active solder ballsbecause the solder disposed on the inactive ball bond pads has feweravenues along which to wick away. In such conventional arrangements, theinactive solder balls may come under greater stress during testing andmay be more likely to become dislodged.

FIG. 3D is an enlarged plan view of another portion of the apparatus 110described above with reference to FIG. 3A. Three of the activeconnection structures 130 shown in FIG. 3D have an electroplating trace134 connected between the central plating bus 124b and the correspondingwire bond pad 132. These active connection structures 130 also have anactive elongated member 133 a extending between the wire bond pad 132and the corresponding bond site 131. These active connection structures130 can further include an active elongated member 133 b having anelongated tab shape generally similar to that of the inactive elongatedmembers 153 b described above. Accordingly, the active connectionstructures 130 and the inactive connection structure 150 shown in FIG.3D can each have the same number of elongated members extending from thecorresponding bond sites, and can accordingly carry conductive couplers(not shown in FIG. 3D) having at least approximately similar shapes in amanner generally similar to that described above with reference to FIGS.3A-C.

FIGS. 4-8 illustrate support members with connection structures havingarrangements in accordance with further embodiments of the invention.For example, FIG. 4 illustrates a support member 420 having an activeconnection structure 430 and an inactive connection structure 450,neither of which includes an electroplating trace. Accordingly, thesupport member 420 can be processed electrolessly to plate theconnection structures 430 and 450 during manufacturing. The activeconnection structure 430 can include an active bond site 431 having anactive elongated member 433 a connected to a corresponding wire bond pad432 in a manner generally similar to that described above. The activeconnection structure 430 can also include a tab-shaped active elongatedmember 433 b extending away from the active bond site 431.

The inactive connection structure 450 can include an inactive bond site451 and two inactive elongated members 453 a and 453 b. In a furtheraspect of this embodiment, the inactive elongated member 453 b caninclude an anchor 455 which can increase the strength of the connectionbetween the inactive connection structure 450 and the support member420. For example, the anchor 455 can provide more surface area beneaththe corresponding cover layer 126 (not shown in FIG. 4), which canfurther reduce the likelihood for tearing the inactive connectionstructure 450 away from the support member 420 when the inactiveconnection structure 450 is subjected to a shear stress. In oneembodiment, the anchor 455 can have a generally triangular shape, and inother embodiments, the anchor 455 can have other shapes. In stillfurther embodiments, the anchor 455 can be included as part of any ofthe elongated members described above or below, when space permits.

FIG. 5 illustrates an embodiment of a support member 520 having anactive connection structure 530 with three active elongated members 533a, 533 b and 533 c. The support member 520 can further include aninactive connection structure 550 having three inactive elongatedmembers 553 a, 553 b and 553 c. The elongated members 533 a and 553 acan be coupled to an edge plating bus (not shown in FIG. 5), and theelongated member 533 b can be coupled to a wire bond pad (not shown inFIG. 5) in a manner generally similar to that described above. Theelongated members 533 a, 533 b and 553 a, as well as the elongatedmembers 533 c, 553 b and 553 c (which are not connected to otherconductive structures) can extend beneath a cover layer 526 to securethe connection structures to the support member 520, as was generallydiscussed above. Alternatively, the cover layer 526 can be eliminatedand the elongated members can be secured to the support member 520 withother techniques. In either embodiment, the active connection structure530 and the inactive connection structure 550 can each include the samenumber of elongated members and can accordingly support conductivecouplers having at least approximately similar shapes and sizes. In afurther aspect of this embodiment, each elongated member can beangularly spaced apart from its neighbor by about 120°. In otherembodiments, the angular spacing can have other values for which theangular spacings for the active elongated members 533 a-c are at leastgenerally similar to those for the inactive elongated members 553 a-c.

FIG. 6 illustrates a support member 620 having an active connectionstructures 630 and an inactive connection structures 650. Theseconnection structures are generally similar to the connection structuresdescribed above except that the connection structures 630 and 650 areconfigured for electroless plating. Accordingly, the active connectionstructure 630 can include an active elongated member 633 b coupled to awire bond pad (not shown in FIG. 6), and can also include two tab-shapedelongated members 633 a and 633 c that are not connected to otherconductive structures. All three inactive elongated members 653 a-c canbe unconnected to other conductive structures.

FIG. 7 illustrates a support member 720 having an active connectionstructure 730 with four active elongated members 733 a-d, and aninactive connection structure 750 having four inactive elongated members753 a-d. The elongated members 733 a and 753 a are each configured to becoupled to a plating bus in a manner generally similar to that describedabove with reference to FIGS. 3B and 5. In one aspect of thisembodiment, each elongated member is angularly spaced apart from itsneighbor by about 90°. In other embodiments, the angular spacing canhave other values with the angular spacing between adjacent activeelongated members 733 a-d being approximately the same as the angularspacing between inactive elongated members 753 a-d, and the number ofactive elongated members 733 being the same as the number of inactiveelongated members.

FIG. 8 illustrates a support member 820 having an active connectionstructure 830 and an inactive connection structure 850, each configuredfor electroless plating. Accordingly, the active connection structure830 can have four active elongated members 833 a-d. The inactiveconnection structure 850 can have four inactive elongated members 853a-d. As described above, the number of and spacing between activeelongated members 833 a-d can be at least approximately the same as forthe inactive elongated members 853 a-d.

In other embodiments, the active and inactive connection structures canhave other shapes and arrangements for which the number of elongatedmembers extending outwardly from an active bond site is equal to thenumber of elongated members extending outwardly from an inactive bondsite. In any of these arrangements, the connection structures and,optionally, the corresponding cover layers, can support conductivecouplers (such as solder balls) having generally similar shapes andsimilar behaviors, regardless of whether the conductive couplers arecarried by an active bond site or an inactive bond site.

FIG. 9 is a schematic illustration of an electronic device 970 thatincludes one or more apparatuses 910 in accordance with an embodiment ofthe invention. In one aspect of this embodiment, the electronic devicecan include a computer, a telecommunication device or another devicethat incorporates microelectronic components. Accordingly, the device910 can include a housing 971 containing a processor 973, a memory 972and/or an input/output device 974, each of which can include anapparatus 910 generally similar to any of the apparatuses describedabove with reference to FIGS. 3A-8. The device 910 can also includeother apparatuses 910 in addition to or in lieu of the apparatusesincorporated into the processor 973, the memory 972 and/or theinput/output device 974.

FIG. 10 is a cross-sectional side view of an apparatus 1010 thatincludes a microelectronic substrate 1040 having a connection structure1030 disposed on it in accordance with another embodiment of theinvention. In one aspect of this embodiment, the microelectronicsubstrate 1040 can have a first surface 1045 and a second surface 1046facing opposite from the first surface 1045. The microelectronicsubstrate 1040 can further include active microelectronic features 1044positioned proximate to the second surface 1046, and a first bond site1041 (such as a bond pad), also positioned proximate to the secondsurface 1046.

The connection structure 1030 can include a second bond site 1031 spacedapart from the first bond site 1041. The second bond site 1031 caninclude a solder ball pad, and can support a conductive coupler 1029,such as a solder ball. Accordingly, the appuratus 1010 can have a “flipchip” configuration. In other embodiments, the second bond site 1031 canhave other configurations and can support other types of conductivecouplers. In any of these embodiments, the connection structure 1030 caninclude an electrically conductive material (such as a metalredistribution layer) and can have a first surface 1037 facing towardthe second surface 1046 of the microelectronic substrate 1040, and asecond surface 1038 facing opposite from the first surface 1037. Theconnection structure 1030 can further include elongated members 1033 aand 1033 b extending outwardly from the second bond site 1031. In oneaspect of this embodiment, the elongated member 1033 a can be connectedbetween the second bond site 1031 of the connection structure and thefirst bond site 1041 of the microelectronic substrate 1040. Theelongated member 1033 b can have a generally tab-shaped configuration,generally similar to those described above.

In a further aspect of this embodiment, the apparatus 1010 can includepassivation layers 1035 (shown as a first passivation layer 1035 a and asecond passivation layer 1035 b) positioned between electricallyconductive elements of the apparatus 1010 to at least partially isolatethese elements from each other For example, the first passivation layer1035 a can be positioned between the second surface 1046 (including theactive microelectronic features 1044) of the microelectronic substrate1040, and the first surface 1037 of the connection structure 1030. Thesecond passivation layer 1035 b can be positioned adjacent to the secondsurface 1038 of the connection structure 1030. In one aspect of thisembodiment, the second passivation layer 1035 b can perform at leastsome of the same functions as the cover layer 126 described abovereference to FIG. 3C. Accordingly, the second passivation layer 1035 bcan aid in securing the connection structure 1030 to the microelectronicsubstrate 1044. In one embodiment, the second passivation layer 1035 bcan extend over the entire lengths of the elongated members 1033 a, 1033b, while leaving the second connection site 1031 exposed to receive theconductive coupler 1029. Alternatively, the second passivation layer1035 b can leave portions of the elongated members 1033 a, 1033 bproximate to the second bond site 1031 exposed to allow the conductivecoupler 1029 to wick along the elongated members 1033 a, 1033 b,generally as was described above with reference to FIG. 3C.

FIG. 11 is a plan view of an embodiment of the apparatus 1010 describedabove with reference to FIG. 10. In one aspect of this embodiment, eachof the elongated members 1033 a can extend between the correspondingfirst bond site 1041 of the microelectronic substrate 1040 and thecorresponding second bond site 1031, and can be generally co-planer witheach other. In an alternative embodiment, the elongated members 1033 acan cross over each other, for example, by extending into differentplanes normal to the plane of FIG. 11 to avoid electrical contact withthe elongated members over which they pass.

In a further aspect of this embodiment, the apparatus 1010 can includean inactive connection structure 1150 having a second bond site 1151.Elongated members 1153 a, 1153 b can extend outwardly from the secondbond site 1151, without being electrically connected to themicroelectronic substrate 1040. Accordingly, the inactive connectionstructures 1150 can support a conductive coupler to provide uniformitywith a pre-selected pattern of conductive couplers, in a mannergenerally similar to that described above.

FIGS. 12A-B illustrate a cross-sectional side view and top isometricview, respectively, of an apparatus 1210 in accordance with anotherembodiment of the invention. In one aspect of this embodiment, theapparatus 1210 can include a microelectronic substrate 1240 having afirst bond site 1241, and a connection structure 1230 having a secondbond site 1231. The microelectronic substrate 1240 can include activedevices 1244 electrically coupled to the first bond site 1241. Theconnection structure 1230 can include a plurality of elongated members1233 (two are shown in FIGS. 12A-B as elongated members 1233 a, 1233 b)extending outwardly from the second bond site 1231. In one aspect ofthis embodiment, the elongated member 1233 a can be coupled between thefirst bond site 1241 and the second bond site 1231, and the elongatedmember 1233 b can include an elongated tab-shaped member generallysimilar to those described above. The bond site 1231 can include asupport portion 1280 carrying a wettable portion 1281. The supportportion 1280 can have a composition generally similar to that of theelongated members 1233 a-1233 b (for example, a composite of aluminum,nickel, copper and titanium), and the wettable portion 1281 can have adifferent composition (such as a composite of nickel and copper).Accordingly, the wettable portion 1281 can be configured to be wetted bya flowable conductive material (such as solder) to support andelectrically couple to a conductive coupler 1229.

In a further aspect of this embodiment, the apparatus 1210 can include adie passivation layer 1235 positioned between the active devices 1244and the connection structure 1230. A first dielectric layer 1236 a canbe disposed between the passivation layer 1235 and the elongated members1233 a, 1233 b, and a second dielectric layer 1236 b can be disposed ontop of the connection structure 1230. In one aspect of an embodimentshown in FIGS. 12A and B, the elongated members 1233 a, 1233 b are notwetted by the conductive coupler 1229 because the wettable portion 1281of the second bond site 1231 does not extend over the elongated members.In an alternate embodiment, the elongated members 1233 a, 1233 b can bewetted by the conductive coupler 1229 in a manner generally similar tothat described above with reference to FIG. 3C.

FIG. 13A is a cross-sectional side view of an apparatus 1310 having aconnection structure 1330 in accordance with another embodiment of theinvention. FIG. 13B is a top isometric view of a portion of theapparatus 1310 shown in FIG. 13A. Referring first to FIG. 13A, theapparatus 1310 can include a microelectronic substrate 1340 having afirst bond site 1341, a passivation layer 1335, and a first dielectriclayer 1336 a disposed on the passivation layer 1335. The connectionstructure 1330 can be disposed on the first dielectric layer 1336 a andcan include a second bond site 1331 electrically connected to the firstbond site 1341 with a connecting trace 1333.

Referring now to FIGS. 13A and 13B, the second bond site 1331 caninclude a generally circular first portion 1382 positioned on the firstdielectric layer 1336 a and electrically connected to the connectingtrace 1333. A second dielectric layer 1336 b can be disposed on theconnection structure 1330, including the first portion 1382 of thesecond bond site 1331. The second bond site 1331 can further include asecond portion 1383 electrically connected to the first portion 1382 andhaving at least two elongated members 1333 a, 1333 b extending outwardlytherefrom over the second dielectric layer 1336 b. In one aspect of thisembodiment, the first portion 1382 can include a composite of titaniumand either copper or aluminum, and the second portion 1383 can include acomposite of titanium, copper, and nickel. In other embodiments, thesecomponents can include other constituents. In any of these embodiments,the elongated member 1333 a, 1333 b can provide some or all of theadvantages described above with reference to the foregoing figures.

FIG. 14 illustrates a top plan view of a support member 1420 forsupporting a microelectronic substrate in accordance with anotherembodiment of the invention. In one aspect of this embodiment, thesupport member 1420 can include a first surface 1421 and a secondsurface 1422 facing opposite from the first surface 1421. The secondsurface 1422 can be configured to carry a microelectronic substrate. Thesupport member 1420 can include connection structures 1430 forconnecting the microelectronic substrate supported on the support member1420 to other electronic or microelectronic devices. In one aspect ofthis embodiment, each connection structure 1430 can include a first bondsite (such as a solder pad) described below with reference to FIG. 15,and a second bond site 1432, such as a wire bond pad, configured to beelectrically coupled to corresponding terminals of the microelectronicsubstrate. The connection structure 1430 can further includeelectroplating traces 1434 configured to connect to a source ofelectrical potential for plating the connection structure 1430,generally in a manner similar to that described above. Alternatively,the connection structures 1430 can be plated with an electrolessprocess.

The connection structures 1430 can further include a connecting trace1439 that extends outwardly from the second bond site 1432. Theconnecting trace 1439 can be coupled to a via 1436 that extends from thesecond surface of the support member 1420 to the first surface 1421. Thevia 1436 can be electrically coupled to the first bond site of thesupport member 1420, as described in greater detail below with referenceto FIG. 15.

FIG. 15 is a bottom plan view of an embodiment of the support member1420 described above with reference to FIG. 14. As shown in FIG. 15,each of the vias 1436 of the connection structures 1430 can extendthrough the support member 1420 to the first surface 1421. Each via 1436can be electrically connected to a corresponding first bond site 1431(such as a solder ball pad), to provide for electrical communicationbetween the first bond site 1431 and the second bond site 1432 (FIG. 14)on the opposite side of the support member. Accordingly, each connectionstructure 1430 can include at least two elongated members 1433 a, 1433 bextending outwardly from the first bond site 1431. The elongated member1433 b can extend between the first bond site 1431 and the via 1436 toprovide for electrical communication between these two components of theconnection structure 1430. The elongated member 1433 a can include agenerally tab-shaped structure generally similar to those describedabove. Accordingly, the elongated members 1433 a, 1433 b can providesome or all of the functions and advantages described above withreference to FIGS. 3A-8. For example, in one aspect of this embodiment,the elongated members 1433 a, 1433 b can aid in securing the first bondsite 1431 to the first surface 1421 of the support member 1420. Thesupport member 1420 can include a cover layer generally similar to thatdescribed above with reference to FIG. 3C to aid in attaching theconnection structure 1430 to the first surface 1421. Accordingly, thecover layer can be configured to either allow or prevent wicking of aflowable conductive material along the elongated members 1433 a, 1433 b.

From the foregoing, it will be appreciated that specific embodiments ofthe invention have been described herein for purposes of illustration,but that various modifications may be made without deviating from thespirit and scope of the invention. Accordingly, the invention is notlimited except as by the appended claims.

1. An apparatus for supporting a microelectronic substrate, comprising:a support substrate having a first surface configured to carry amicroelectronic substrate and a second surface facing opposite from thefirst surface; a first connection structure disposed on the secondsurface of the support substrate and configured to remain decoupled fromthe microelectronic substrate when the support substrate carries themicroelectronic substrate, the first connection structure having a firstbond site configured to receive a flowable conductive material, thefirst connection structure further having a first number of firstelongated members connected to and extending outwardly from the firstbond site, wherein none of the first elongated members is configured tobe electrically connected to the microelectronic substrate; and a secondconnection structure disposed on the second surface of the supportsubstrate, the second connection structure having a second bond siteconfigured to receive a flowable conductive material, the secondconnection structure being configured to be coupled to themicroelectronic substrate when the support substrate carries themicroelectronic substrate, the second connection structure furtherhaving a second number of second elongated members extending outwardlyfrom the second bond site, the second number being the same as the firstnumber.
 2. The apparatus of claim 1 wherein each of the first elongatedmembers is configured to receive at least a portion of the flowableconductive material and wherein each of the second elongated members isconfigured to receive at least a portion of the flowable conductivematerial.
 3. The apparatus of claim 1, further comprising a layerdisposed on the first and second elongated members and attached to thesupport substrate, the layer having a first aperture aligned with thefirst bond site and a second aperture aligned with the second bond site,and wherein a covered portion of each first and second elongated membersextends between the layer and the support substrate, and an exposedportion of each elongated member is exposed through one of the first andsecond apertures, further wherein each exposed portion has approximatelythe same length.
 4. The apparatus of claim 1, further comprising a layerdisposed on the first and second elongated members and attached to thesupport substrate, the layer having a first aperture aligned with thefirst bond site and a second aperture aligned with the second bond site,and wherein the layer covers junctions between the first bond site andthe first elongated members, and covers junctions between the secondbond site and the second elongated members.
 5. The apparatus of claim 1wherein the first bond site includes a solder pad having a diameter ofabout 330 microns and wherein at least one of the first elongatedmembers has a length of about 250 microns, further wherein the apparatusfurther comprises a solder mask disposed over the first and secondelongated members and attached to the support substrate, the solder maskhaving a first aperture aligned with the first bond site and a secondaperture aligned with the second bond site, and wherein a coveredportion of the at least one first elongated member extends beneath thesolder mask for a distance of about 200 microns.
 6. The apparatus ofclaim 1 wherein the second connection structure has a third bond siteconfigured to be wire bonded to the microelectronic substrate when themicroelectronic substrate is carried by the support substrate, andwherein at least one of the second elongated members extends between thesecond and third bond sites.
 7. The apparatus of claim 1 wherein thefirst and second elongated members are configured to be wetted by theflowable conductive material when the flowable conductive material isdisposed on the first bond site and placed in a flowable state.
 8. Theapparatus of claim 1 wherein the first conductive structure includes twofirst elongated members extending away from opposite sides of the firstbond site.
 9. The apparatus of claim 1, further comprising a layerdisposed on the first and second elongated members and attached to thesupport substrate, the layer having a first aperture aligned with thefirst bond site and a second aperture aligned with the second bond site.10. The apparatus of claim 1 wherein the first connection structureincludes at least one electrically conductive metallic material.
 11. Theapparatus of claim 1 wherein one of the first elongated members isshorter than another of the first elongated members.
 12. The apparatusof claim 1 wherein at least one of the elongated members is temporarilycoupled to a plating bus to provide electrical current to the firstconnection structure during formation of the support substrate.
 13. Theapparatus of claim 1 wherein the first bond site includes a solder ballpad, and wherein the apparatus further comprises a solder ball disposedon the solder ball pad.
 14. The apparatus of claim 1, furthercomprising: a first solder ball disposed on the first bond site andhaving a first size and shape; a second solder ball disposed on thesecond bond site and having a second size at least approximately thesame as the first size, and a second shape at least approximately thesame as the first shape; and a microelectronic substrate carried by thesupport substrate, the microelectronic substrate being electricallycoupled to the second connection structure and being electricallyisolated from the first connection structure.
 15. The apparatus of claim1 wherein the first connection structure and the second connectionstructure each have two elongated members.
 16. The apparatus of claim 1wherein the first connection structure and the second connectionstructure each have three elongated members.
 17. The apparatus of claim1 wherein at least one of the first elongated members has a first endconnected to the first bond site and a second end spaced apart from thefirst bond site, and wherein the at least one first elongated memberincludes an anchor toward the second end to secure the at least onefirst elongated member to the support substrate.
 18. The apparatus ofclaim 1 wherein each of the first and second elongated members has anaxis along which the member is elongated and wherein each member has awidth transverse to the axis, further wherein the widths of all theelongated members on the support substrate are approximately equal. 19.The apparatus of claim 1 wherein the support substrate includes a slotextending between the first and second surfaces, the slot beingpositioned to receive wires extending between the second connectionstructure and the microelectronic substrate when the support substratecarries the microelectronic substrate.
 20. The apparatus of claim 1,further comprising: a first solder ball disposed on the first bond siteand projecting away from the first bond site by a first distance; and asecond solder ball disposed on the second bond site and projecting awayfrom the second bond site by a second distance at least approximatelythe same as the first distance.
 21. An apparatus for supporting amicroelectronic substrate, comprising: a support substrate having afirst surface configured to carry a microelectronic substrate and asecond surface facing opposite from the first surface; a first bond sitedisposed on the second surface of the support substrate and configuredto remain decoupled from the microelectronic substrate when the supportsubstrate carries the microelectronic substrate; first elongated membersconnected to and extending outwardly from the first bond site; a firstportion of a flowable conductive material disposed on the first bondsite, the first portion of the flowable conductive material projectingfrom the first bond site in a direction generally normal to the firstbond site by a first distance; a second bond site disposed on the secondsurface of the support substrate and configured to be electricallycoupled to the microelectronic substrate when the support substratecarries the microelectronic substrate; second elongated membersextending outwardly from the second bond site; and a second portion of aflowable conductive material disposed on the second bond site, thesecond portion of the flowable conductive material projecting from thesecond bond site in a direction generally normal to the second bond siteby a second distance at least approximately equal to the first distance.22. The apparatus of claim 21 wherein the first bond site has a total ofa first number of first elongated members and the second bond site has atotal of a second number of second elongated members, and wherein thefirst number is the same as the second number.
 23. The apparatus ofclaim 21, further comprising a third bond site configured to be wirebonded to the microelectronic substrate when the microelectronicsubstrate is carried by the support substrate, and wherein at least oneof the second elongated members extends between the second and thirdbond sites.
 24. The apparatus of claim 21 wherein at least part of thefirst portion of the flowable conductive material extends along thefirst elongated members, and wherein at least part of the second portionof the flowable conductive material extends along the second elongatedmembers.
 25. The apparatus of claim 21 wherein the first elongatedmembers include two first elongated members extending away from oppositesides of the first bond site.
 26. The apparatus of claim 21, furthercomprising a layer disposed on the first and second elongated membersand attached to the support substrate, the layer having a first aperturealigned with the first bond site and a second aperture aligned with thesecond bond site.
 27. The apparatus of claim 21, further comprising alayer disposed on the first and second elongated members and attached tothe support substrate, the layer having a first aperture aligned withthe first bond site and a second aperture aligned with the second bondsite, and wherein a covered portion of each first and second elongatedmember extends between the layer and the support substrate and anexposed portion of each elongated member is exposed through one of thefirst and second apertures, further wherein each exposed portion hasapproximately the same length.
 28. The apparatus of claim 21 wherein thefirst elongated members include at least one electrically conductivemetallic material.
 29. The apparatus of claim 21 wherein the first bondsite includes a solder ball pad, and wherein the flowable conductivematerial includes a solder ball disposed on the solder ball pad.
 30. Theapparatus of claim 21, further comprising: a first solder ball disposedon the first bond site; a second solder ball disposed on the second bondsite; and a microelectronic substrate carried by the support substrate,the microelectronic substrate being electrically coupled to the secondbond site and being electrically isolated from the first bond site. 31.The apparatus of claim 21 wherein at least one of the first elongatedmembers has a first end connected to the first bond site and a secondend spaced apart from the first bond site, and wherein the at least onefirst elongated member includes an anchor toward the second end tosecure the at least one first elongated member to the support substrate.32. An apparatus for supporting a microelectronic substrate, comprising:a support substrate having a first surface configured to carry amicroelectronic substrate and a second surface facing opposite from thefirst surface; a first connection structure disposed on the secondsurface of the support substrate and having a first bond site configuredto receive a flowable conductive material and remain electricallyisolated from the microelectronic substrate when the microelectronicsubstrate is carried by the support substrate, the first connectionstructure further having at least two first elongated members connectedto and extending outwardly from the first bond site, wherein each of thefirst elongated members is configured to receive at least a portion ofthe flowable conductive material; and a plurality of second connectionstructures disposed on the second surface of the support substrate, eachsecond connection structure having a second bond site configured toreceive a flowable conductive material, each second connection structurebeing configured to be electrically coupled to the microelectronicsubstrate when the support substrate carries the microelectronicsubstrate, each second connection structure still further having atleast two second elongated members extending outwardly from the secondbond site, wherein each of the second elongated members is configured toreceive at least a portion of the flowable conductive material from thesecond bond site, further wherein none of the second connectionstructures are coupled to any first connection structures of the supportsubstrate.
 33. The apparatus of claim 32 wherein all of the first andsecond connection structures of the support substrate have the samenumber of elongated members.
 34. The apparatus of claim 32 wherein eachsecond connection structure has a third bond site configured to be wirebonded to the microelectronic substrate when the microelectronicsubstrate is carried by the support substrate, and wherein and at leastone of the second elongated members of each second connection structureextends between the second and third bond sites of that secondconnection structure.
 35. The apparatus of claim 32 wherein the firstand second elongated members are configured to be wetted by the flowableconductive material when the flowable conductive material is disposed onthe first bond site and placed in a flowable state.
 36. The apparatus ofclaim 32 wherein the first conductive structure includes two firstelongated members extending away from opposite sides of the first bondsite.
 37. The apparatus of claim 32, further comprising a layer disposedon the first and second elongated members and attached to the supportsubstrate, the layer having a first aperture aligned with the first bondsite and a second aperture aligned with the second bond site.
 38. Theapparatus of claim 32, further comprising a layer disposed on the firstand second elongated members and attached to the support substrate, thelayer having a first aperture aligned with the first bond site and asecond aperture aligned with the second bond site, and wherein a coveredportion of each first and second elongated member extends between thelayer and the support substrate, and an exposed portion of eachelongated member is exposed through one of the first and secondapertures, further wherein each exposed portion has approximately thesame length.
 39. The apparatus of claim 32 wherein the first connectionstructure includes at least one electrically conductive metallicmaterial.
 40. The apparatus of claim 32 wherein the first bond siteincludes a solder ball pad, and wherein the apparatus further comprisesa solder ball disposed on the solder ball pad.
 41. The apparatus ofclaim 32, further comprising: a first solder ball disposed on the firstbond site; a second solder ball disposed on the second bond site of eachsecond connection structure; and a microelectronic substrate carried bythe support substrate, the microelectronic substrate being electricallycoupled to the second connection structures and being electricallyisolated from the first connection structure.
 42. The apparatus of claim32 wherein at least one of the first elongated members has a first endconnected to the first bond site and a second end spaced apart from thefirst bond site, and wherein the at least one first elongated memberincludes an anchor toward the second end to secure the at least onefirst elongated member to the support substrate.
 43. The apparatus ofclaim 32, further comprising: a first solder ball disposed on the firstbond site and projecting away from the first bond site by a firstdistance; and a second solder ball disposed on the second bond site andprojecting away from the second bond site by a second distance at leastapproximately the same as the first distance.
 44. A microelectronicassembly, comprising: a microelectronic substrate; a support substratehaving a first surface carrying the microelectronic substrate and asecond surface facing opposite from the first surface; and a connectionstructure disposed on the second surface of the support substrate, theconnection structure having a bond site configured to receive a flowableconductive material, the connection structure further having at leasttwo elongated members connected to and extending outwardly from the bondsite with none of the elongated members being electrically coupled tothe microelectronic substrate.
 45. The assembly of claim 44 wherein eachelongated member is configured to receive at least a portion of theflowable conductive material from the bond site.
 46. The assembly ofclaim 44 wherein the connection structure is a first connectionstructure and the elongated members are first elongated membersconfigured to receive at least a portion of a flowable conductivematerial from the first bond site, and wherein the apparatus furthercomprises a second connection structure carried by the supportsubstrate, the second connection structure having a second bond siteconfigured to receive a flowable conductive material, the secondconnection structure being electrically coupled to the microelectronicsubstrate and having second elongated members extending outwardly fromthe second bond site, wherein each of the second elongated members isconfigured to receive at least a portion of the flowable conductivematerial from the second bond site.
 47. The assembly of claim 44 whereinthe connection structure is a first connection structure and theelongated members are first elongated members, and wherein the apparatusfurther comprises a second connection structure carried by the supportsubstrate, the second connection structure having a second bond siteconfigured to receive a flowable conductive material, the secondconnection structure having a third bond site electrically coupled tothe microelectronic substrate, the second connection structure furtherhaving second elongated members extending outwardly from the second bondsite, wherein each of the second elongated members is configured toreceive at least a portion of the flowable conductive material from thesecond bond site, and wherein at least one of the second elongatedmembers extends between the second and third bond sites.
 48. Theassembly of claim 44 wherein the elongated members are configured to bewetted by the flowable conductive material when the flowable conductivematerial is in a flowable state.
 49. The assembly of claim 44 whereinthe conductive structure includes exactly two elongated membersextending away from opposite sides of the bond site.
 50. The assembly ofclaim 44, further comprising a layer disposed on the elongated membersand attached to the support substrate, the layer having an aperturealigned with the bond site.
 51. The assembly of claim 44, furthercomprising a layer disposed on the elongated members and attached to thesupport substrate, the layer having an aperture aligned with the bondsite, and wherein a covered portion of each elongated member extendsbetween the layer and the support substrate, and an exposed portion ofeach elongated member is exposed through the aperture, further whereineach exposed portion has approximately the same length.
 52. The assemblyof claim 44 wherein the connection structure includes at least oneelectrically conductive metallic material.
 53. The assembly of claim 44wherein the bond site includes a solder ball pad, and wherein theapparatus further comprises a solder ball disposed on the solder ballpad.
 54. The assembly of claim 44 wherein at least one of the elongatedmembers has a first end connected to the bond site and a second endspaced apart from the bond site, and wherein the at least one elongatedmember includes an anchor toward the second end to secure the at leastone elongated member to the support substrate.
 55. The assembly of claim44 wherein the support substrate includes a slot extending between thefirst and second surfaces, and wherein the apparatus further compriseswires extending through the slot between the second connection structureand the microelectronic substrate.
 56. The assembly of claim 44 whereinthe connection structure is a first connection structure and theelongated members are first elongated members configured to receive atleast a portion of a flowable material from the first bond site, andwherein the apparatus further comprises a second connection structurecarried by the support substrate, the second connection structure havinga second bond site configured to receive a flowable conductive material,the second connection structure being electrically coupled to themicroelectronic substrate and having second elongated members extendingoutwardly from the second bond site, wherein each of the secondelongated members is configured to receive at least a portion of theflowable conductive material from the second bond site, and wherein theapparatus further comprises: a first solder ball disposed on the firstbond site and projecting away from the first bond site by a firstdistance; and a second solder ball disposed on the second bond site andprojecting away from the second bond site by a second distance at leastapproximately the same as the first distance.
 57. A microelectronicassembly, comprising: a microelectronic substrate; a support substratehaving a first surface carrying the microelectronic substrate and asecond surface facing opposite from the first surface; an inactiveconnection structure disposed on the second surface of the supportsubstrate, the inactive connection structure having a first bond pad incontact with a first solder ball, the inactive connection structurefurther having at least two first elongated conductive members, each ofwhich extends outwardly from the first bond pad and neither of which iselectrically coupled to the microelectronic substrate, the firstconductive members each contacting at least a portion of the firstsolder ball; an active connection structure disposed on the secondsurface of the support substrate, the active connection structure havinga second bond pad in contact with a second solder ball, the activeconnection structure further having a third bond pad configured toreceive a wire bond, the active connection structure still furtherhaving at least two second elongated conductive members each extendingoutwardly from the second bond pad, wherein at least one of the secondconductive members extends between the second bond pad and the thirdbond pad, and wherein each of the second conductive members contacts atleast a portion of the second solder ball; a wire bond connected betweenthe microelectronic substrate and the third bond pad; and a solder maskdisposed on the active and inactive connection structures, the soldermask having a first aperture aligned with the first bond pad and asecond aperture aligned with the second bond pad.
 58. The assembly ofclaim 57 wherein the first bond pad has a diameter of about 330 micronsand wherein each of the first conductive members has a length of about250 microns or more, further wherein a covered portion of each of thefirst conductive members extends beneath the solder mask for a distanceof about 200 microns.
 59. The assembly of claim 57 wherein the inactiveconnection structure and the active connection structure each have thesame number of conductive members.
 60. The assembly of claim 57 whereinat least one of the first elongated conductive members has a first endconnected to the first bond pad and a second end spaced apart from thefirst bond pad, and wherein the at least one first elongated conductivemember includes an anchor toward the second end to secure the at leastone first elongated conductive member to the support substrate.
 61. Theassembly of claim 57, further comprising: a first solder ball disposedon the first bond site and projecting away from the first bond site by afirst distance; and a second solder ball disposed on the second bondsite and projecting away from the second bond site by a second distanceat least approximately the same as the first distance.